Residual Gas Analysis of Devices [Contract Analysis Service]
We will accept samples at our lab and provide contract analysis services for residual gases in devices.
Analysis Application Examples (Accumulation Method) Destructive Analysis - Measurement of residual and emitted gases between each layer of semiconductor chips - Measurement of gas emissions from semiconductor wafer substrates - Measurement of residual gases within MEMS device chips Non-Destructive Analysis - Leak testing and gas emission measurement of sealed devices
- Company:東京電子
- Price:Other